IRIS
WYSS, JEFFERY
 Distribuzione geografica
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Continente #
EU - Europa 3.079
NA - Nord America 2.385
AS - Asia 996
Continente sconosciuto - Info sul continente non disponibili 6
OC - Oceania 2
SA - Sud America 2
AF - Africa 1
Totale 6.471
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Nazione #
US - Stati Uniti d'America 2.381
IE - Irlanda 975
SE - Svezia 644
CN - Cina 537
DE - Germania 461
UA - Ucraina 418
IT - Italia 306
TR - Turchia 228
SG - Singapore 140
FI - Finlandia 95
GB - Regno Unito 81
IN - India 75
FR - Francia 34
BE - Belgio 21
RU - Federazione Russa 11
AT - Austria 9
EU - Europa 6
HK - Hong Kong 6
NL - Olanda 5
RO - Romania 5
DK - Danimarca 4
LU - Lussemburgo 4
CA - Canada 3
AU - Australia 2
IL - Israele 2
KW - Kuwait 2
AE - Emirati Arabi Uniti 1
CL - Cile 1
CZ - Repubblica Ceca 1
EC - Ecuador 1
HU - Ungheria 1
ID - Indonesia 1
JP - Giappone 1
MA - Marocco 1
PA - Panama 1
PL - Polonia 1
PT - Portogallo 1
SA - Arabia Saudita 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
UZ - Uzbekistan 1
VN - Vietnam 1
Totale 6.471
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Città #
Dublin 974
Chandler 550
Jacksonville 305
Izmir 228
Rome 221
Nanjing 187
Boardman 151
Singapore 93
Lawrence 85
Princeton 85
Wilmington 84
Ann Arbor 80
Nanchang 76
Woodbridge 69
Ashburn 68
Beijing 56
Ogden 51
Grafing 50
Brooklyn 47
Dearborn 43
Los Angeles 42
Pune 39
Inglewood 38
Tianjin 36
Seattle 30
Des Moines 29
Shenyang 29
Changsha 28
New York 27
Orange 27
Hebei 24
Bremen 22
Helsinki 22
Jiaxing 22
Brussels 21
Brandenburg 20
Kunming 20
Santa Clara 18
Cassino 17
Verona 14
Auburn Hills 13
Milan 12
Falls Church 9
Norwalk 9
Vienna 9
Hangzhou 8
Jinan 7
Munich 7
L’Aquila 6
Shanghai 6
Lanzhou 5
Legnaro 5
Ningbo 5
Saint Petersburg 5
San Francisco 5
Walnut 5
Zhengzhou 5
Cambridge 4
Changchun 4
Copenhagen 4
Hong Kong 4
Luxembourg 4
Staten Island 4
Dronten 3
Guangzhou 3
Hefei 3
Redmond 3
San Mateo 3
Tappahannock 3
Toronto 3
Fairfield 2
Gelsenkirchen 2
Kuwait City 2
Padova 2
Redwood City 2
Saint Paul 2
Shaoxing 2
Baotou 1
Baruth 1
Bratislava 1
Brescia 1
Budapest 1
Camisano Vicentino 1
Canberra 1
Central 1
Cork 1
Frankfurt am Main 1
Haikou 1
Hanoi 1
Harbin 1
Horia 1
Lappeenranta 1
Lisbon 1
Ljubljana 1
Miami 1
Modena 1
Naaldwijk 1
Naples 1
North Bergen 1
Olomouc 1
Totale 4.231
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Nome #
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs 107
Charge generation mechanisms in low-voltage power MOSFETs during radiation exposure 102
An Experimental Classification of Drain and Gate Current Pulses in Low-Voltage Power MOSFETs During Radiation Exposure 101
A novel sensor for ion electron emission microscopy. 100
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment 98
Effects of heavy ion impact on power diodes 96
Non-destructive tester for single event burnout of power diodes 96
Anomalous charge loss from floating-gate memory cells due to heavy ion irradiation 95
A time-resolved IBICC experiment using the IEEM of the SIRAD facility 94
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impacts in the 2.5-7.9 MeV/amu energy range 93
SIRAD: AN IRRADIATION FACILITY AT THE LNL TANDEM ACCELERATOR FOR RADIATION DAMAGE STUDIES ON SEMICONDUCTOR DETECTORS AND ELECTRONIC DEVICES AND SYSTEMS 91
Ion Impact Detection and Micromapping with a SDRAM for IEEM Diagnostics and Applications 91
Charge Collection effiency of standard and oxygenated silicon microstrip detectors 90
Radiation-induced effects on the XAA1.2 ASIC chip for space application 90
Accelerated wear-out of ultra-thin gate oxides after irradiation 90
Advanced proton imaging in computed tomography 90
RADIATION EFFECTS ON FLOATING-GATE MEMORY CELLS 89
Detection Efficiency and Spatial Resolution of the SIRAD Ion Electron Emission Microscope 89
Experimental measurement of recombination lifetime in proton irradiated power devices 89
Ion electron emission microscopy at SIRAD 88
Position sensitive detectors for ion electron emission microscopy 88
Gate Damages Induced in SiC Power MOSFETs During Heavy Ion Irradiation (Part II) 88
Experimental Measurements of Recombination Lifetime in Proton Irradiated Power Devices 87
Lithium ion-induced damage in silicon detectors 87
The Reliability of New Generation Power MOSFETs in Radiation Environment 87
Single event upset studies on the CMS tracker APV25 readout chip 86
Experimental study on the effect of the gate oxide thickness and the epitaxial layer resistivity on the reliability of low blocking voltage power VDMOSFET during heavy ions exposure 86
EFFETCS OF HEAVY ION IMPACT ON POWER DIODES 85
Silicon Detectors for gamma-ray and beta-spectroscopy 85
RADIATION DAMAGE OF STANDARD AND OXYGENATED SILICON DIODES IRRADIATIED BY 16-MEV AND 27-MEV PROTONS 84
Radiation defects in neutron irradiated silicon with high oxygen concentrations 84
Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons 84
LOW- AND HIGH-ENERGY PROTON IRRADIATIONS OF STANDARD AND OXYGENATED SILICON DIODES 84
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5–7.9 MeV/amu energy range 84
Status of the ion electron emission microscope at the SIRAD single event facility 84
Observation of B^{+}→ψ(2S)K^{+} and B^{0}→ψ(2S)K^{*}(892)^{0} decays and measurements of B-meson branching fractions into J/ψ and ψ(2S) final states 83
Radiation hardness of silicon detectors for high-energy physics applications 83
Experimental Study on the Reliability of Low Blocking Voltage Power VDMOSFET During Heavy Ion Exposure 83
Silicon diode radiation hardening for high energy physics detectors 83
THE FUTURE OF THE SIRAD SEE FACILITY: ION-ELECTRON EMISSION MISROSCOPY 82
Experimental Study of Charge Generation Mechanisms in Power MOSFETs due to Energetic Particle Impact 81
null 81
Neutron irradiation effects on standard and oxygenated silicon diodes 80
Performance of the SIRAD ion electron emission microscope 80
Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation--Part I 80
ION ELECTRON EMISSION MICROSCOPY AT THE SIRAD SINGLE EVENT FACILITY 79
Semiconductor detectors for neutron flux measurements 79
Effects of proton irradiation on glass filter substrates for the Rosetta mission 79
Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact 78
Effect of the Epitaxial Layer Features on the Reliability of Medium Blocking Voltage Power VDMOSFET during Heavy Ion Exposure 77
A Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 77
First results from a novel monolithic pixel sensor 76
First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM 75
HEAVY ION IRRADIATION OF THIN GATE OXIDES 75
The SPES project at the INFN- Laboratori Nazionali di Legnaro 75
Proton irradiation effects on standard and oxygenated silicon diodes 74
LOW FIELD LEAKAGE CURRENT AND SOFT BREAKDOWN IN ULTRA-THIN GATE OXIDES AFTER HEAVY ION, ELECTRONS OR X-RAY IRRADIATION 73
LePIX: first results from a novel monolithic pixel sensor 72
ANEM: The future neutron production target for Single Event Effect studies at LNL 72
THIN OXIDE DEGRADATION AFTER HIGH-ENERGY ION IRRADIATION 71
High energy Si ion irradiation effects on 10nm thick oxide MOS capacitors 71
High-Energy Ion Irradiation Effects on Thin Oxide p-Channel MOSFETs 70
Total Dose Effects on a FD-SOI Technology for Monolithic Pixel Sensors 70
Investigation of t-tbar in the full hadronic final state at CDF with a neural network approach 69
IBICC Sensitivity Map of a Power MOSFET with the SIRAD IEEM 69
ANEM: A rotating composite target to produce an atmospheric-like neutron beam at the LNL SPES facility 69
Nuclear Structure Studies with Stable and Radioactive Beams: The SPES radioactive ion beam project 67
CMOS sensors in 90 nm fabricated on high resistivity wafers: Design concept and irradiation results 66
Measurement of the inclusive jet cross section inpp¯collisions ats=1.8TeV 66
Status and prospects of the SIRAD irradiation facility for radiation effects studies at LNL 65
The QMN Beam Line of the Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 65
The SPES project of INFN: Facility and detectors 65
LNL irradiation facilities for radiation damage studies on electronic devices 63
Neutron production targets for a new Single Event Effects facility at the 70 MeV Cyclotron of LNL-INFN 62
The SPES project: a second generation ISOL facility 62
The SPES radioactive ion beam project of INFN 62
Measurement of thett¯production cross section inpp¯collisions at sqrt(s)=1.8TeV 62
Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy 61
The SPES Radioactive Ion Beam facility of INFN 60
iMPACT: An Innovative Tracker and Calorimeter for Proton Computed Tomography 57
SPES and the neutron facilities at Laboratori Nazionali di Legnaro 56
Fast Neutrons at LNL Legnaro 56
Calorimeter prototyping for the iMPACT project pCT scanner 55
LINUS, the Integrated LNL Neutron Source facility 47
The Phase 0 of the NEPIR project at LNL 38
Nuclear physics midterm plan at Legnaro National Laboratories (LNL) 22
CoolGAL: a Galinstan bathed Be fast neutron production target at the NEPIR facility 3
Totale 6.688
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Categoria #
all - tutte 30.493
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 30.493
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020412 0 0 0 0 3 128 47 90 23 18 99 4
2020/2021763 94 6 91 90 23 116 7 85 16 100 30 105
2021/2022634 5 1 4 53 52 8 59 55 111 4 115 167
2022/20232.655 174 203 118 147 219 498 0 128 1.084 2 40 42
2023/2024471 49 21 37 22 31 68 53 49 83 6 1 51
2024/2025322 43 26 107 28 118 0 0 0 0 0 0 0
Totale 6.688