IRIS
WYSS, JEFFERY
 Distribuzione geografica
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Continente #
EU - Europa 3.048
NA - Nord America 2.187
AS - Asia 852
Continente sconosciuto - Info sul continente non disponibili 6
OC - Oceania 2
SA - Sud America 2
Totale 6.097
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Nazione #
US - Stati Uniti d'America 2.183
IE - Irlanda 973
SE - Svezia 644
CN - Cina 535
DE - Germania 454
UA - Ucraina 418
IT - Italia 296
TR - Turchia 228
FI - Finlandia 86
GB - Regno Unito 81
IN - India 75
FR - Francia 34
BE - Belgio 21
RU - Federazione Russa 10
AT - Austria 9
EU - Europa 6
HK - Hong Kong 6
RO - Romania 5
DK - Danimarca 4
LU - Lussemburgo 4
NL - Olanda 4
CA - Canada 3
AU - Australia 2
IL - Israele 2
KW - Kuwait 2
CL - Cile 1
EC - Ecuador 1
HU - Ungheria 1
ID - Indonesia 1
JP - Giappone 1
PA - Panama 1
PL - Polonia 1
PT - Portogallo 1
SG - Singapore 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
VN - Vietnam 1
Totale 6.097
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Città #
Dublin 972
Chandler 550
Jacksonville 305
Izmir 228
Rome 221
Nanjing 187
Lawrence 85
Princeton 85
Wilmington 84
Ann Arbor 80
Nanchang 76
Woodbridge 69
Ashburn 68
Boardman 62
Beijing 56
Ogden 51
Grafing 50
Brooklyn 47
Dearborn 43
Pune 39
Inglewood 38
Tianjin 36
Seattle 30
Des Moines 29
Shenyang 29
Changsha 28
New York 27
Orange 27
Hebei 24
Bremen 22
Jiaxing 22
Brussels 21
Brandenburg 20
Kunming 20
Cassino 17
Los Angeles 15
Helsinki 14
Verona 14
Auburn Hills 13
Milan 12
Falls Church 9
Norwalk 9
Vienna 9
Hangzhou 8
Jinan 7
Shanghai 6
Lanzhou 5
Legnaro 5
Ningbo 5
Saint Petersburg 5
San Francisco 5
Walnut 5
Zhengzhou 5
Cambridge 4
Changchun 4
Copenhagen 4
Hong Kong 4
Luxembourg 4
Staten Island 4
Dronten 3
Guangzhou 3
Hefei 3
Redmond 3
San Mateo 3
Tappahannock 3
Toronto 3
Fairfield 2
Gelsenkirchen 2
Kuwait City 2
Redwood City 2
Saint Paul 2
Shaoxing 2
Baotou 1
Baruth 1
Bratislava 1
Brescia 1
Budapest 1
Canberra 1
Central 1
Cork 1
Frankfurt am Main 1
Haikou 1
Hanoi 1
Harbin 1
Horia 1
Lisbon 1
Ljubljana 1
Miami 1
Modena 1
Naaldwijk 1
Naples 1
Padova 1
Phoenix 1
Qingdao 1
Quito 1
Sacramento 1
Secaucus 1
Selargius 1
Singapore 1
Sydney 1
Totale 3.984
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Nome #
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs 101
Charge generation mechanisms in low-voltage power MOSFETs during radiation exposure 97
An Experimental Classification of Drain and Gate Current Pulses in Low-Voltage Power MOSFETs During Radiation Exposure 96
A novel sensor for ion electron emission microscopy. 96
Non-destructive tester for single event burnout of power diodes 93
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment 92
Effects of heavy ion impact on power diodes 91
Anomalous charge loss from floating-gate memory cells due to heavy ion irradiation 88
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impacts in the 2.5-7.9 MeV/amu energy range 88
SIRAD: AN IRRADIATION FACILITY AT THE LNL TANDEM ACCELERATOR FOR RADIATION DAMAGE STUDIES ON SEMICONDUCTOR DETECTORS AND ELECTRONIC DEVICES AND SYSTEMS 87
Ion Impact Detection and Micromapping with a SDRAM for IEEM Diagnostics and Applications 87
Charge Collection effiency of standard and oxygenated silicon microstrip detectors 86
Position sensitive detectors for ion electron emission microscopy 86
A time-resolved IBICC experiment using the IEEM of the SIRAD facility 86
Ion electron emission microscopy at SIRAD 85
Radiation-induced effects on the XAA1.2 ASIC chip for space application 85
Detection Efficiency and Spatial Resolution of the SIRAD Ion Electron Emission Microscope 85
Advanced proton imaging in computed tomography 85
Experimental measurement of recombination lifetime in proton irradiated power devices 85
RADIATION EFFECTS ON FLOATING-GATE MEMORY CELLS 84
Accelerated wear-out of ultra-thin gate oxides after irradiation 84
Experimental Measurements of Recombination Lifetime in Proton Irradiated Power Devices 83
The Reliability of New Generation Power MOSFETs in Radiation Environment 83
Lithium ion-induced damage in silicon detectors 82
EFFETCS OF HEAVY ION IMPACT ON POWER DIODES 81
Radiation defects in neutron irradiated silicon with high oxygen concentrations 81
Single event upset studies on the CMS tracker APV25 readout chip 81
Experimental study on the effect of the gate oxide thickness and the epitaxial layer resistivity on the reliability of low blocking voltage power VDMOSFET during heavy ions exposure 81
Status of the ion electron emission microscope at the SIRAD single event facility 81
Silicon Detectors for gamma-ray and beta-spectroscopy 81
null 81
LOW- AND HIGH-ENERGY PROTON IRRADIATIONS OF STANDARD AND OXYGENATED SILICON DIODES 80
Experimental Study on the Reliability of Low Blocking Voltage Power VDMOSFET During Heavy Ion Exposure 80
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5–7.9 MeV/amu energy range 80
RADIATION DAMAGE OF STANDARD AND OXYGENATED SILICON DIODES IRRADIATIED BY 16-MEV AND 27-MEV PROTONS 79
Silicon diode radiation hardening for high energy physics detectors 79
Observation of B^{+}→ψ(2S)K^{+} and B^{0}→ψ(2S)K^{*}(892)^{0} decays and measurements of B-meson branching fractions into J/ψ and ψ(2S) final states 78
Radiation hardness of silicon detectors for high-energy physics applications 78
THE FUTURE OF THE SIRAD SEE FACILITY: ION-ELECTRON EMISSION MISROSCOPY 78
Gate Damages Induced in SiC Power MOSFETs During Heavy Ion Irradiation (Part II) 78
Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons 77
Performance of the SIRAD ion electron emission microscope 76
Experimental Study of Charge Generation Mechanisms in Power MOSFETs due to Energetic Particle Impact 76
ION ELECTRON EMISSION MICROSCOPY AT THE SIRAD SINGLE EVENT FACILITY 75
Semiconductor detectors for neutron flux measurements 75
Effects of proton irradiation on glass filter substrates for the Rosetta mission 75
Neutron irradiation effects on standard and oxygenated silicon diodes 74
Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact 74
Effect of the Epitaxial Layer Features on the Reliability of Medium Blocking Voltage Power VDMOSFET during Heavy Ion Exposure 73
A Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 73
First results from a novel monolithic pixel sensor 73
HEAVY ION IRRADIATION OF THIN GATE OXIDES 72
Proton irradiation effects on standard and oxygenated silicon diodes 72
First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM 71
The SPES project at the INFN- Laboratori Nazionali di Legnaro 71
Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation--Part I 71
THIN OXIDE DEGRADATION AFTER HIGH-ENERGY ION IRRADIATION 69
LOW FIELD LEAKAGE CURRENT AND SOFT BREAKDOWN IN ULTRA-THIN GATE OXIDES AFTER HEAVY ION, ELECTRONS OR X-RAY IRRADIATION 69
ANEM: The future neutron production target for Single Event Effect studies at LNL 69
LePIX: first results from a novel monolithic pixel sensor 68
High-Energy Ion Irradiation Effects on Thin Oxide p-Channel MOSFETs 67
High energy Si ion irradiation effects on 10nm thick oxide MOS capacitors 67
Investigation of t-tbar in the full hadronic final state at CDF with a neural network approach 66
IBICC Sensitivity Map of a Power MOSFET with the SIRAD IEEM 65
Total Dose Effects on a FD-SOI Technology for Monolithic Pixel Sensors 64
ANEM: A rotating composite target to produce an atmospheric-like neutron beam at the LNL SPES facility 64
The SPES project of INFN: Facility and detectors 64
CMOS sensors in 90 nm fabricated on high resistivity wafers: Design concept and irradiation results 63
Measurement of the inclusive jet cross section inpp¯collisions ats=1.8TeV 63
The QMN Beam Line of the Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 62
Nuclear Structure Studies with Stable and Radioactive Beams: The SPES radioactive ion beam project 62
Status and prospects of the SIRAD irradiation facility for radiation effects studies at LNL 60
LNL irradiation facilities for radiation damage studies on electronic devices 60
Neutron production targets for a new Single Event Effects facility at the 70 MeV Cyclotron of LNL-INFN 59
Measurement of thett¯production cross section inpp¯collisions at sqrt(s)=1.8TeV 59
Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy 58
The SPES radioactive ion beam project of INFN 58
The SPES project: a second generation ISOL facility 57
The SPES Radioactive Ion Beam facility of INFN 57
SPES and the neutron facilities at Laboratori Nazionali di Legnaro 53
iMPACT: An Innovative Tracker and Calorimeter for Proton Computed Tomography 51
Calorimeter prototyping for the iMPACT project pCT scanner 50
LINUS, the Integrated LNL Neutron Source facility 45
Fast Neutrons at LNL Legnaro 45
The Phase 0 of the NEPIR project at LNL 35
Nuclear physics midterm plan at Legnaro National Laboratories (LNL) 15
Totale 6.314
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Categoria #
all - tutte 23.845
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 23.845
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019336 0 0 0 0 0 0 0 0 0 0 79 257
2019/2020701 211 8 6 64 3 128 47 90 23 18 99 4
2020/2021763 94 6 91 90 23 116 7 85 16 100 30 105
2021/2022634 5 1 4 53 52 8 59 55 111 4 115 167
2022/20232.655 174 203 118 147 219 498 0 128 1.084 2 40 42
2023/2024419 49 21 37 22 31 68 53 49 83 6 0 0
Totale 6.314