IRIS
WYSS, JEFFERY
 Distribuzione geografica
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Continente #
EU - Europa 3.749
NA - Nord America 3.588
AS - Asia 1.962
SA - Sud America 87
AF - Africa 17
Continente sconosciuto - Info sul continente non disponibili 6
OC - Oceania 4
Totale 9.413
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Nazione #
US - Stati Uniti d'America 3.544
IE - Irlanda 975
CN - Cina 796
SE - Svezia 649
DE - Germania 588
SG - Singapore 553
UA - Ucraina 419
RU - Federazione Russa 354
IT - Italia 343
TR - Turchia 230
HK - Hong Kong 196
FI - Finlandia 146
GB - Regno Unito 113
IN - India 101
BR - Brasile 66
FR - Francia 49
VN - Vietnam 38
CA - Canada 27
AT - Austria 24
BE - Belgio 24
PL - Polonia 17
JP - Giappone 14
MX - Messico 14
NL - Olanda 14
BD - Bangladesh 9
ES - Italia 9
EC - Ecuador 8
ZA - Sudafrica 8
AR - Argentina 7
RO - Romania 7
EU - Europa 6
IL - Israele 5
AU - Australia 4
DK - Danimarca 4
LU - Lussemburgo 4
MA - Marocco 4
AE - Emirati Arabi Uniti 3
IQ - Iraq 3
SA - Arabia Saudita 3
UZ - Uzbekistan 3
CO - Colombia 2
DZ - Algeria 2
HU - Ungheria 2
KE - Kenya 2
KW - Kuwait 2
PT - Portogallo 2
UY - Uruguay 2
BH - Bahrain 1
CL - Cile 1
CZ - Repubblica Ceca 1
DM - Dominica 1
DO - Repubblica Dominicana 1
EG - Egitto 1
ID - Indonesia 1
IR - Iran 1
LB - Libano 1
LT - Lituania 1
LV - Lettonia 1
MK - Macedonia 1
PA - Panama 1
PK - Pakistan 1
PY - Paraguay 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
TL - Timor Orientale 1
Totale 9.413
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Città #
Dublin 974
Dallas 608
Chandler 550
Jacksonville 305
Singapore 301
Izmir 228
Rome 222
Ashburn 195
Hong Kong 194
Nanjing 187
Boardman 152
The Dalles 143
Beijing 101
Munich 97
Hefei 94
Lawrence 85
Princeton 85
Wilmington 84
Ann Arbor 80
Nanchang 76
Woodbridge 69
Los Angeles 67
Moscow 62
New York 61
Helsinki 58
Brooklyn 56
Ogden 51
Grafing 50
Dearborn 43
Pune 39
Inglewood 38
Tianjin 36
Seattle 35
Santa Clara 32
Des Moines 29
Shenyang 29
Changsha 28
Orange 27
Brussels 24
Hebei 24
Bremen 22
Jiaxing 22
Brandenburg 20
Kunming 20
Milan 18
Cassino 17
Verona 16
Nuremberg 15
Warsaw 15
Montreal 14
Tokyo 14
Auburn Hills 13
Frankfurt am Main 13
Mumbai 13
Vienna 12
Hanoi 11
Houston 11
Poplar 11
Chicago 10
Ho Chi Minh City 10
São Paulo 10
Boston 9
Denver 9
Falls Church 9
Norwalk 9
Orem 9
San Francisco 9
Chennai 8
Hangzhou 8
Johannesburg 8
Guangzhou 7
Jinan 7
London 7
L’Aquila 7
St Petersburg 7
Council Bluffs 6
Lappeenranta 6
Manchester 6
Phoenix 6
Shanghai 6
Lanzhou 5
Legnaro 5
Mexico City 5
Ningbo 5
Saint Petersburg 5
Stockholm 5
Toronto 5
Turku 5
Walnut 5
Zhengzhou 5
Assago 4
Atlanta 4
Belo Horizonte 4
Cambridge 4
Changchun 4
Copenhagen 4
Jyväskylä 4
Luxembourg 4
Staten Island 4
Amsterdam 3
Totale 6.158
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Nome #
Advanced proton imaging in computed tomography 249
Heavy-Ion Radiation Test on LTC1668 DAC 239
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs 160
An Experimental Classification of Drain and Gate Current Pulses in Low-Voltage Power MOSFETs During Radiation Exposure 149
A time-resolved IBICC experiment using the IEEM of the SIRAD facility 139
Charge Collection effiency of standard and oxygenated silicon microstrip detectors 138
Anomalous charge loss from floating-gate memory cells due to heavy ion irradiation 136
CoolGAL: a Galinstan bathed Be fast neutron production target at the NEPIR facility 135
Charge generation mechanisms in low-voltage power MOSFETs during radiation exposure 132
A novel sensor for ion electron emission microscopy. 131
Accelerated wear-out of ultra-thin gate oxides after irradiation 130
Effects of heavy ion impact on power diodes 129
Detection Efficiency and Spatial Resolution of the SIRAD Ion Electron Emission Microscope 125
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment 124
Non-destructive tester for single event burnout of power diodes 123
Experimental measurement of recombination lifetime in proton irradiated power devices 121
Ion Impact Detection and Micromapping with a SDRAM for IEEM Diagnostics and Applications 118
Gate Damages Induced in SiC Power MOSFETs During Heavy Ion Irradiation (Part II) 118
ARCADIA fully depleted CMOS MAPS development with LFoundry 110 nm CIS 117
Effects of proton irradiation on glass filter substrates for the Rosetta mission 117
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impacts in the 2.5-7.9 MeV/amu energy range 116
Experimental Study on the Reliability of Low Blocking Voltage Power VDMOSFET During Heavy Ion Exposure 116
A Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 116
Experimental Measurements of Recombination Lifetime in Proton Irradiated Power Devices 112
Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs 111
Effect of the Epitaxial Layer Features on the Reliability of Medium Blocking Voltage Power VDMOSFET during Heavy Ion Exposure 111
EFFETCS OF HEAVY ION IMPACT ON POWER DIODES 111
Radiation-induced effects on the XAA1.2 ASIC chip for space application 111
Experimental Study of Charge Generation Mechanisms in Power MOSFETs due to Energetic Particle Impact 111
Ion electron emission microscopy at SIRAD 110
Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5–7.9 MeV/amu energy range 110
RADIATION DAMAGE OF STANDARD AND OXYGENATED SILICON DIODES IRRADIATIED BY 16-MEV AND 27-MEV PROTONS 109
SIRAD: AN IRRADIATION FACILITY AT THE LNL TANDEM ACCELERATOR FOR RADIATION DAMAGE STUDIES ON SEMICONDUCTOR DETECTORS AND ELECTRONIC DEVICES AND SYSTEMS 109
Radiation hardness of silicon detectors for high-energy physics applications 109
Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation--Part I 109
Observation of B^{+}→ψ(2S)K^{+} and B^{0}→ψ(2S)K^{*}(892)^{0} decays and measurements of B-meson branching fractions into J/ψ and ψ(2S) final states 108
Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons 108
RADIATION EFFECTS ON FLOATING-GATE MEMORY CELLS 108
The Reliability of New Generation Power MOSFETs in Radiation Environment 108
Neutron irradiation effects on standard and oxygenated silicon diodes 107
Single event upset studies on the CMS tracker APV25 readout chip 107
Performance of the SIRAD ion electron emission microscope 107
Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact 107
Experimental study on the effect of the gate oxide thickness and the epitaxial layer resistivity on the reliability of low blocking voltage power VDMOSFET during heavy ions exposure 107
LOW- AND HIGH-ENERGY PROTON IRRADIATIONS OF STANDARD AND OXYGENATED SILICON DIODES 105
Position sensitive detectors for ion electron emission microscopy 105
Status of the ion electron emission microscope at the SIRAD single event facility 105
THE FUTURE OF THE SIRAD SEE FACILITY: ION-ELECTRON EMISSION MISROSCOPY 104
Silicon Detectors for gamma-ray and beta-spectroscopy 104
Silicon diode radiation hardening for high energy physics detectors 103
ANEM: A rotating composite target to produce an atmospheric-like neutron beam at the LNL SPES facility 103
Radiation defects in neutron irradiated silicon with high oxygen concentrations 102
The SPES project at the INFN- Laboratori Nazionali di Legnaro 102
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs 101
Lithium ion-induced damage in silicon detectors 101
CMOS sensors in 90 nm fabricated on high resistivity wafers: Design concept and irradiation results 100
Proton irradiation effects on standard and oxygenated silicon diodes 100
LOW FIELD LEAKAGE CURRENT AND SOFT BREAKDOWN IN ULTRA-THIN GATE OXIDES AFTER HEAVY ION, ELECTRONS OR X-RAY IRRADIATION 99
ANEM: The future neutron production target for Single Event Effect studies at LNL 99
ION ELECTRON EMISSION MICROSCOPY AT THE SIRAD SINGLE EVENT FACILITY 97
HEAVY ION IRRADIATION OF THIN GATE OXIDES 97
Measurement of the inclusive jet cross section inpp¯collisions ats=1.8TeV 97
Calorimeter prototyping for the iMPACT project pCT scanner 95
Total Dose Effects on a FD-SOI Technology for Monolithic Pixel Sensors 94
Semiconductor detectors for neutron flux measurements 93
First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM 93
LePIX: first results from a novel monolithic pixel sensor 93
Status and prospects of the SIRAD irradiation facility for radiation effects studies at LNL 93
THIN OXIDE DEGRADATION AFTER HIGH-ENERGY ION IRRADIATION 92
High-Energy Ion Irradiation Effects on Thin Oxide p-Channel MOSFETs 91
First results from a novel monolithic pixel sensor 90
IBICC Sensitivity Map of a Power MOSFET with the SIRAD IEEM 90
Nuclear Structure Studies with Stable and Radioactive Beams: The SPES radioactive ion beam project 90
High energy Si ion irradiation effects on 10nm thick oxide MOS capacitors 89
Investigation of t-tbar in the full hadronic final state at CDF with a neural network approach 85
iMPACT: An Innovative Tracker and Calorimeter for Proton Computed Tomography 85
Measurement of thett¯production cross section inpp¯collisions at sqrt(s)=1.8TeV 84
Fast Neutrons at LNL Legnaro 84
The SPES project of INFN: Facility and detectors 83
Neutron production targets for a new Single Event Effects facility at the 70 MeV Cyclotron of LNL-INFN 80
The SPES project: a second generation ISOL facility 80
The QMN Beam Line of the Neutron-induced Single Event Effects Facility at the 70 MeV Cyclotron of LNL-INFN 80
The SPES radioactive ion beam project of INFN 79
LNL irradiation facilities for radiation damage studies on electronic devices 78
Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy 76
SPES and the neutron facilities at Laboratori Nazionali di Legnaro 75
The SPES Radioactive Ion Beam facility of INFN 72
LINUS, the Integrated LNL Neutron Source facility 59
The Phase 0 of the NEPIR project at LNL 52
Nuclear physics midterm plan at Legnaro National Laboratories (LNL) 43
Fast neutron production at the LNL Tandem from the $$^7$$Li($$^{14}$$N,xn)X reaction 26
On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments 22
Study of a simplified CoolGal target to support the Phase-0 NEPIR facility 18
null 15
Totale 9.671
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Categoria #
all - tutte 43.960
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 43.960
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021459 0 0 0 0 0 116 7 85 16 100 30 105
2021/2022634 5 1 4 53 52 8 59 55 111 4 115 167
2022/20232.655 174 203 118 147 219 498 0 128 1.084 2 40 42
2023/2024471 49 21 37 22 31 68 53 49 83 6 1 51
2024/20251.463 42 26 107 28 126 26 236 129 452 29 152 110
2025/20261.842 209 626 362 212 354 79 0 0 0 0 0 0
Totale 9.671