This paper deals with the Electromagnetic Compatibility (EMC) issues related to the direct and radiated emissions from a high-speed integrated circuit (IC). These emissions are here evaluated by means of circuital and electromagnetic models. As for the conducted emission, an equivalent circuit model is derived to describe the IC and the effect of its loads (package, printed circuit board, decaps, etc..), based on the Integrated Circuit Emission Model template (ICEM). As for the radiated emission, an electromagnetic model is proposed, based on the superposition of the fields generated in the far field region by the loop currents flowing into the IC and the package pins. A custom experimental setup is designed for validating the models. Specifically, for the radiated emission measurement, a custom test board is designed and realized, able to highlight the contribution of the direct emission from the IC, usually hidden by the indirect emission coming from the printed circuit board. Measurements of the package currents and of the far-field emitted fields are carried out, providing a satisfactory agreement with the model predictions.

Accurate Models for Evaluating the Direct Conducted and Radiated Emissions from Integrated Circuits

Capriglione, Domenico;Chiariello, Andrea;Maffucci, Antonio
2018

Abstract

This paper deals with the Electromagnetic Compatibility (EMC) issues related to the direct and radiated emissions from a high-speed integrated circuit (IC). These emissions are here evaluated by means of circuital and electromagnetic models. As for the conducted emission, an equivalent circuit model is derived to describe the IC and the effect of its loads (package, printed circuit board, decaps, etc..), based on the Integrated Circuit Emission Model template (ICEM). As for the radiated emission, an electromagnetic model is proposed, based on the superposition of the fields generated in the far field region by the loop currents flowing into the IC and the package pins. A custom experimental setup is designed for validating the models. Specifically, for the radiated emission measurement, a custom test board is designed and realized, able to highlight the contribution of the direct emission from the IC, usually hidden by the indirect emission coming from the printed circuit board. Measurements of the package currents and of the far-field emitted fields are carried out, providing a satisfactory agreement with the model predictions.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11580/69785
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