In this paper a surface integral formulation is used for the terminal characterization in huge frequency ranges of conducting bodies, with an automatic treatment of complex topologies.
Broad-Band Characterization of Conductors with Arbitrary Topology Using a Surface Integral Formulation
MAFFUCCI, Antonio;VILLONE, Fabio;
2006-01-01
Abstract
In this paper a surface integral formulation is used for the terminal characterization in huge frequency ranges of conducting bodies, with an automatic treatment of complex topologies.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
