Smaller size, lower power supply voltages, and higher operating frequencies enhance the performance of devices but increase electromagnetic compatibility (EMC) issues. As for the radiated emissions problem, the device is usually regarded as the source of transient currents. Radiated fields are usually assumed to be generated by the flow of such currents in PCB traces and connecting cables. Recently, more attention has been given to emissions coming directly from the device itself (from microcontrollers and Flash memory devices). EMC analysis of ICs is usually carried out by means of experimental characterization and numerical simulation.
Modeling and Characterization of EMC behavior of Flash Memory Devices
CAPRIGLIONE, Domenico;CHIARIELLO, Andrea Gaetano;MAFFUCCI, Antonio;
2011-01-01
Abstract
Smaller size, lower power supply voltages, and higher operating frequencies enhance the performance of devices but increase electromagnetic compatibility (EMC) issues. As for the radiated emissions problem, the device is usually regarded as the source of transient currents. Radiated fields are usually assumed to be generated by the flow of such currents in PCB traces and connecting cables. Recently, more attention has been given to emissions coming directly from the device itself (from microcontrollers and Flash memory devices). EMC analysis of ICs is usually carried out by means of experimental characterization and numerical simulation.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
