Modeling and Characterization of Parasitic Radiated Emission from a Flash Memory

This paper deals with the electromagnetic modeling and characterization of Flash memory devices, in terms of radiated emission. An experimental setup has been specifically designed to highlight the direct contribution to the emissions coming from the device and to minimize emissions coming from the board and the other equipment. The experimental characterization is carried out in an anechoic chamber. An electromagnetic model is derived by using an ICEM model for the memory device and the package, a distributed circuital model for the board, and an electromagnetic model for the field emissions of the current loops. Measurements and simulations of the currents and of the emitted field have been compared to validate the circuital and the electromagnetic model. Analysis of the EMC behavior of four different devices (150nm and 110nm technologies) has been performed. In particular, the sensitivity to different operating conditions and to variation in the parameter values of the package currents has been investigated.