This paper analyzes the radiated emissions of a system consisting of an IC (a Flash memory device) and its package (PQFP80). The system is described by means of an IC emission model (ICEM). The radiated emissions are estimated by means of an electromagnetic model for the field emissions of current loops. Experimental characterization was conducted to measure the currents on the package and the far-field emitted fields. The models were experimentally validated and used to analyze case studies for different devices using 150nm and 110nm technologies.
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