RicercaInizia una nuova ricerca
NOTA: è possibile cercare una corrispondenza esatta usando i doppi apici, ad es: "evoluzione della specie". Qualora si cerchi un identificativo, è consigliabile cercarlo in due modi differenti: tra apici con caratteri speciali es: "978-94-6366-274" oppure senza caratteri speciali solo come sequenza numerica: es 978946366274.
A probe array for fast quantitative eddy current imaging
2007-01-01 Abbate, C; Morozov, M; Rubinacci, G; Tamburrino, Antonello; Ventre, Salvatore
A quadratic approach for the reconstruction of conductivity profiles using eddy current
1996-01-01 Pierri, R.; Rubinacci, G.; Tamburrino, Antonello
A Quadratic Approach in Microwave Tomography and Resistivity Retrieval
1997-01-01 R., Pierri; G., Leone; G., Rubinacci; Tamburrino, Antonello
A real-time eddy-current tomography system: design and optimization
2017-01-01 Maffucci, A.; Perrotta, A.; Rubinacci, G.; Ventre, S.; Tamburrino, A.
A Second Order approximation for conductivity imaging
1998-01-01 Rubinacci, G.; Tamburrino, Antonello; Ventre, Salvatore; Villone, F.
A volume integral formulation for broadband solution of Maxwell equations
2005-01-01 Rubinacci, G.; Tamburrino, Antonello
Adaptive Wavelets for Characterizing Magnetic Flux Leakage Signals From Pipeline Inspection
2006-01-01 Joshi, A; Udpa, L; Udpa, S; Tamburrino, Antonello
Aeronautical Structures Examination Using FLUXSET Type ECT Probe
2006-01-01 Morozov, M; Rubinacci, G; Tamburrino, Antonello; Ventre, Salvatore; Villone, F.
Aeronautical Structures Examination Using FLUXSET Type ECT Probe
2002-01-01 M., Morozov; G., Rubinacci; Tamburrino, Antonello; Ventre, Salvatore; Villone, Fabio
An Eddy-Current Testing Method for Measuring the Thickness of Metallic Plates
2023-01-01 Sardellitti, Alessandro; Milano, Filippo; Laracca, Marco; Ventre, Salvatore; Ferrigno, Luigi; Tamburrino, Antonello
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
A probe array for fast quantitative eddy current imaging | 1-gen-2007 | Abbate, C; Morozov, M; Rubinacci, G; Tamburrino, Antonello; Ventre, Salvatore | |
A quadratic approach for the reconstruction of conductivity profiles using eddy current | 1-gen-1996 | Pierri, R.; Rubinacci, G.; Tamburrino, Antonello | |
A Quadratic Approach in Microwave Tomography and Resistivity Retrieval | 1-gen-1997 | R., Pierri; G., Leone; G., Rubinacci; Tamburrino, Antonello | |
A real-time eddy-current tomography system: design and optimization | 1-gen-2017 | Maffucci, A.; Perrotta, A.; Rubinacci, G.; Ventre, S.; Tamburrino, A. | |
A Second Order approximation for conductivity imaging | 1-gen-1998 | Rubinacci, G.; Tamburrino, Antonello; Ventre, Salvatore; Villone, F. | |
A volume integral formulation for broadband solution of Maxwell equations | 1-gen-2005 | Rubinacci, G.; Tamburrino, Antonello | |
Adaptive Wavelets for Characterizing Magnetic Flux Leakage Signals From Pipeline Inspection | 1-gen-2006 | Joshi, A; Udpa, L; Udpa, S; Tamburrino, Antonello | |
Aeronautical Structures Examination Using FLUXSET Type ECT Probe | 1-gen-2006 | Morozov, M; Rubinacci, G; Tamburrino, Antonello; Ventre, Salvatore; Villone, F. | |
Aeronautical Structures Examination Using FLUXSET Type ECT Probe | 1-gen-2002 | M., Morozov; G., Rubinacci; Tamburrino, Antonello; Ventre, Salvatore; Villone, Fabio | |
An Eddy-Current Testing Method for Measuring the Thickness of Metallic Plates | 1-gen-2023 | Sardellitti, Alessandro; Milano, Filippo; Laracca, Marco; Ventre, Salvatore; Ferrigno, Luigi; Tamburrino, Antonello |
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile
Opzioni
Scopri
Tipologia
- 4 Contributo in Atti di Convegno ... 114
- 1 Contributo su Rivista 108
- 1 Contributo su Rivista::1.1 Arti... 108
- 4 Contributo in Atti di Convegno ... 96
- 2 Contributo in Volume 50
- 2 Contributo in Volume::2.1 Contr... 50
- 4 Contributo in Atti di Convegno ... 18
- 7 Curatele 3
- 7 Curatele::7.1 Curatela 3
- 5 Altro 1
- 5 Altro::5.12 Altro 1
Data di pubblicazione
- 2020 - 2024 21
- 2010 - 2019 107
- 2000 - 2009 128
- 1995 - 1999 20
Editore
- IOS Press 31
- Ios Press 9
- IEEE 7
- IEEE / Institute of Electrical an... 5
- AMSTERDAM, NETHERLANDS: IOS PRESS... 4
- Institute of Electrical and Elect... 3
- American Institute of Physics 2
- IEEE Press 2
- NA 2
- -Washington, DC: Optical Society ... 1
Rivista
- IEEE TRANSACTIONS ON MAGNETICS 34
- INTERNATIONAL JOURNAL OF APPLIED ... 19
- NDT & E INTERNATIONAL 9
- INVERSE PROBLEMS 7
- COMPEL 6
- IEEE TRANSACTIONS ON ANTENNAS AND... 4
- IEEE SENSORS JOURNAL 3
- APPLIED COMPUTATIONAL ELECTROMAGN... 2
- IEEE TRANSACTIONS ON INSTRUMENTAT... 2
- JOURNAL OF MODERN OPTICS 2
Serie
- STUDIES IN APPLIED ELECTROMAGNETI... 16
- AIP CONFERENCE PROCEEDINGS 5
- STUDIES IN APPLIED ELECTROMAGNETI... 2
- AIP CONFERENCE PROCEEDINGS 1
- FRONTIERS IN ARTIFICIAL INTELLIGE... 1
Keyword
- inverse problems 6
- Nondestructive examination 5
- Eddy current testing 4
- Eddy currents 4
- integral equations 4
- Dimensional analysis 3
- eddy current 3
- Eddy Current Testing 3
- Electrical resistance tomography 3
- Electromagnetic scattering 3
Lingua
- eng 227
- ita 4
Accesso al fulltext
- no fulltext 247
- restricted 21
- open 7
- reserved 1