PALAZZO, Simone
PALAZZO, Simone
Dipartimento di Ingegneria Elettrica e dell'Informazione "Maurizio Scarano"
A Hybrid Modulation Technique for Voltage Regulation in LLC Converters in the Presence of Transformer Parasitic Capacitance
2022-01-01 Palazzo, Simone; Busatto, Giovanni; De Santis, Enzo; Giacomobono, Roberto; Di Ruzza, Dario; Panariello, Giuseppe
A Novel Modulation Technique for Pulsating DC Link Multistage Converter with Zero Voltage Transition Based on Different and Unrelated Switching Frequencies
2021-01-01 Marciano, D.; Palazzo, S.; Abbate, C.; Busatto, G.; Sanseverino, A.; Tedesco, D.; Velardi, F.
A Simple Thermal Model for Junction and Hot Spot Temperature Estimation of 650 V GaN HEMT during Short Circuit
2024-01-01 Palazzo, S.; Sanseverino, A.; Canale Parola, G.; Martano, E.; Velardi, F.; Busatto, G.
An accurate switching current measurement based on resistive shunt applied to short circuit gan hemt characterization
2021-01-01 Abbate, C.; Colella, L.; Di Folco, R.; Busatto, G.; Martano, E.; Palazzo, S.; Sanseverino, A.; Velardi, F.
Analysis and Modeling of a 650 V GaN-based Half Bridge during Short Circuit operation
2023-06-05 Palazzo, Simone
Energy Efficient Architecture of Power Supply for Field Devices and Controllers of the RFI Computer-Based Interlocking
2022-01-01 Panariello, G.; Di Ruzza, D.; Canigliula, M.; Palazzo, S.; Busatto, G.; de Santis, and E.
High Frequency, High Efficiency, and High Power Density GaN-Based LLC Resonant Converter: State-of-the-Art and Perspectives
2021-01-01 Abolfazl Mortazavizadeh, Seyed; Palazzo, Simone; Amendola, Arturo; DE SANTIS, Enzo; Di Ruzza, Dario; Panariello, Giuseppe; Sanseverino, Annunziata; Velardi, Francesco; Busatto, Giovanni
Physical mechanisms for gate damage induced by heavy ions in SiC power MOSFET
2020-01-01 Busatto, G.; Di Pasquale, A.; Marciano, D.; Palazzo, S.; Sanseverino, A.; Velardi, F.
Role of Active Clamp Circuit in a DC/AC Isolated Converter based on the principle of Pulsating DC Link
2021-01-01 Marciano, D.; Palazzo, S.; Busatto, G.; Sanseverino, A.; Velardi, F.